TO PAN

TO PAN is a dental phantom that allows the complex focal trough of the panoramic x-ray unit to be quantified. This allows full assessment of parameters affecting image quality. Can be used in film and digital systems.

TO PAN enables:

• Quantification of the focal trough and image layer
• Accurate determination of the bite offset
• Quantification of the symmetry of the scan
• Measurement of the incident beams angles
• Simple visualisation of faults.
• Spatial Resolution testing (test patterns available separately)

TO PAN comes with a tripod for universal positioning