TO PAN is a dental phantom that allows the complex focal trough of the panoramic x-ray unit to be quantified. This allows full assessment of parameters affecting image quality. Can be used in film and digital systems.

TO PAN enables:

  • Quantification of the focal trough and image layer
  • Accurate determination of the bite offset
  • Quantification of the symmetry of the scan
  • Measurement of the incident beams angles
  • Simple visualisation of faults.
  • Spatial Resolution testing (test patterns available separately)
TO PAN Phantom
TO PAN Phantom

TO PAN PhantomTO PAN resolution patternsTO PAN detail